SPring-8

Synchrotron radiation that precisely captures the static state of atoms and molecules

Each one is a one-of-a-kind experimental sites

The Large Synchrotron Radiation Facility “SPring-8” and the X-ray Free Electron Laser Facility “SACLA” will provide even stronger support than ever for R activities by industry, government, and academia toward achieving the Sustainable Development Goals (SDGs) and carbon neutrality by 2050. At the same time, we will further advance efforts to make the facilities themselves even more energy-efficient. We respectfully ask for your continued and increased use and support.

SPring-8 Beamline MAP

Click here for the PDF beamline map

01

BL01B1 XAFS I
- Wide energy range (3.8–113 keV)
- XAFS of dilute and thin-film samples
- Time-resolved XAFS by quick scan (time-resolved QXAFS)
Persons in charge | Kazuo Kato, Masayoshi Katayama
02

BL02B1 Single-Crystal Structural Analysis
- High-precision structural analysis using high-resolution data
- Micro single-crystal structural analysis
- Exploration of structural phase transitions in response to external fields
Persons in charge | Yuiga Nakamura, Kohei Ichiyanagi, Sumit Maity, Toshiyuki Sasaki
02

BL02B2 Powder Crystal Structural Analysis
- Precise structural studies at the electron-density level closely related to physical properties in crystalline materials
- Research on structural phase transitions
- Structure determination using powder diffraction data
- Structure refinement by the Rietveld method
- In situ/operando powder structural measurements (e.g., gas/solvent atmospheres at low/high temperatures, under MPa pressure, under light irradiation, etc.)
Persons in charge | Shogo Kawaguchi, Daiki Yamada, Shintaro Kobayashi
03

BL03XU RIKEN Analytical Science III
- R on organic and polymer materials, including thin films, fibers, bulk, films, and solutions
- Structural analysis by small-angle/wide-angle X-ray scattering measurements
- Tracking structural changes under controlled environments using large user-provided equipment
- Observation of hierarchical structural changes from Å to μm scales via simultaneous measurements
Person in charge | Hiroyasu Masunaga
04

BL04B1 High Temperature and High Pressure
- In situ measurements under high temperature and high pressure using a large-volume press and electrical resistance heating
- Energy-dispersive powder X-ray diffraction using white X-rays of 20–150 keV (2θ = 3–16°)
- Two-dimensional X-ray diffraction using monochromatic X-rays in the 30–60 keV range (2θ < 10°)
- X-ray absorption imaging
- Elastic-wave velocity measurements under high-temperature and high-pressure conditions
Persons in charge | Norihide Tsujino, Sho Kakizawa, Yuji Higo
04

BL04B2 High-Energy X-ray Diffraction
- Structural analysis of glass, liquids, and amorphous materials
- X-ray diffraction using high-energy X-rays of 61 and 113 keV
Persons in charge | Daiki Yamada, Seiya Shimono
05

BL05XU Facility Development ID I
- Micro single-crystal structural analysis
- Light source and optics development
- Synchrotron Radiation measurement technology development
Person in charge | Yujiro Hayashi
07

BL07LSU Facility Development ID II
- Condensed Matter Physics
- Physical Chemistry
- Applied Chemistry
- Applied Physics
Person in charge | Masaki Oura

08

BL08W High-Energy Inelastic Scattering
- Magnetic Compton scattering measurements
- High-resolution Compton scattering measurements
- High-energy X-ray diffraction
- High-energy X-ray fluorescence analysis (XRF)
- Time-resolved PDF analysis
Persons in charge | Seiki Tsuji, Daiki Yamada, Seiya Shimono, Yuki Mizuno
08

BL08B2 RIKEN Regional Collaboration II

Persons in charge | Shigeo Kuwamoto, Yoshimasa Urushihara
09

BL09XU HAXPES Ⅰ
- Electronic-state analysis of buried interfaces with high energy resolution
- Element- and orbital-selective electronic-state analysis by resonant excitation using absorption edges (resonant HAXPES)
- Local 3D spatially resolved electronic-state analysis using a focused beam and angle-resolved measurements
- Polarization-dependent photoelectron spectroscopy using a diamond X-ray phase retarder
- Material Science and applied materials science via photoelectron measurements at low temperatures
Persons in charge | Yasumasa Takagi, Akira Yasui, Jiayi Tang
10

BL10XU High-Pressure Structural Properties
- X-ray crystal structural analysis under high pressure using a diamond anvil cell
- In situ/operando exploration of structural changes and elucidation of compression behavior under combined extreme conditions
- High-pressure Earth and Planetary Science
- High-pressure Material Science
Persons in charge | Naohisa Hirao, Hirokazu Kadobayashi, Sho Kakizawa
11

BL11XU QST Extreme Quantum Dynamics I
(National Institutes for Quantum Science and Technology)
- Mössbauer spectroscopy
- Resonant inelastic X-ray scattering
- X-ray emission spectroscopy
- Surface X-ray diffraction (in situ observation of III–V semiconductor crystal growth)
- Coherent X-ray diffraction imaging
Persons in charge | Takamasa Fujiwara, Kenji Ishii
12

BL12XU NSRRC ID (Taiwan NSRRC)
- X-ray inelastic scattering
- X-ray emission spectroscopy
- Hard X-ray photoelectron spectroscopy
Persons in Charge | Nozomu Hiraoka, Masato Yoshimura
12

BL12B2 NSRRC BM (Taiwan NSRRC)
- X-ray absorption spectroscopy
- Powder X-ray diffraction
Persons in Charge | Hirofumi Ishii, Yu-Cheng SHAO
13

BL13XU X-ray Diffraction Scattering I
- Material structural analysis and process observation
- Atomic-level structural analysis of thin-film, bulk, and nanoscale materials
- High-resolution powder diffraction
- High-energy X-ray diffraction
- X-ray diffraction under in-situ/operando conditions
- Local structural analysis using nanobeam X-ray diffraction
Persons in Charge | Kazutsugu Sumiya, Tomoyuki Koganezawa, Shogo Kawaguchi

14

BL14B1 QST Extreme Quantum Dynamics II
(National Institutes for Quantum Science and Technology)
- X-ray diffraction under high temperature and high pressure, focusing on hydrogen materials
- XAFS of dilute samples
- Time-resolved energy-dispersive XAFS
- Biological irradiation research
Persons in Charge | Hiroyuki Saito, Ayumi Jo
14

BL14B2 XAFS Ⅱ
- Wide-band XAFS measurements (3.8–72 keV)
- XAFS measurements of dilute/thin-film samples
- Time-resolved XAFS measurements by quick scan
- X-ray imaging
Persons in Charge | Hironobu Obuchi, Tsuyoshi Watanabe, Liu Yuwei, Kentaro Kajiwara, Yoshimasa Urushihara, Masafumi Takagaki
15

BL15XU RIKEN Material Science III
- High-energy laminography system
- Large deformation press
- Portable compact deformation press
- High-pressure PDF diffractometer
Persons in Charge | Hiroyuki Osumi, Yujiro Hayashi, Yuji Higo, Norihide Tsujino, Sho Kakizawa
16

BL16XU RIKEN Analytical Science I
- Multipurpose 6-axis X-ray diffractometer
- General-purpose X-ray diffraction measurements
- Material structural analysis of thin films, bulk samples, etc.
- X-ray diffraction under in-situ/operando conditions
- High-energy X-ray diffraction
Person in Charge | Tomoyuki Koganezawa
16

BL16B2 RIKEN Analytical Science II
- X-ray topography
Person in Charge | Kentaro Kajiwara
17

BL17SU RIKEN Physical Science III
- Scanning Soft X-ray Spectromicroscope --- A3 station: Microspectroscopic observation of sample surfaces under low vacuum to He atmospheric pressure. Enables local fluorescent X-ray analysis, elemental distribution mapping, and soft X-ray absorption spectroscopy.
- User-brought-in area --- Bc station: focused beam available
  Electronic/magnetic state imaging using a general-purpose photoelectron microscope (resolution: 100 nm)
  and its time-resolved measurements
  User-brought-in equipment experiments are also possible by replacing it with a general-purpose photoelectron microscope
Persons in Charge | Masaki Oura, Toshinori Ina, Kohei Yamagami
19

BL19LXU RIKEN Physical Science II
- All fields requiring this high-brilliance light source
Persons in Charge | Kenji Tamasaku, Yuya Kubota
19

BL19B2 X-ray Diffraction Scattering II
- Residual stress measurements, thin-film structural analysis, surfaces, interfaces
- Powder X-ray diffraction
- X-ray topography
- Small-angle X-ray scattering (ultra-small-angle scattering)
Persons in Charge | Rosantha Kumara, Keishi Akada, Keiichi Osaka, Tomotaka Nakatani, Osamu Ikeda, Kanae Ito, Shigeo Kuwamoto

20

BL20XU Medical Imaging II
- X-ray micro/nano imaging: micro-CT, nano-CT, refraction/phase-contrast imaging, X-ray diffraction CT (XRD-CT, DCT), microbeam/scanning microscopy
- R and evaluation of various X-ray optical systems and optical elements; coherent optics experiments
- Ultra-small-angle scattering
Persons in Charge | Akihisa Takeuchi, Masayuki Uesugi, Yuki Sada
20

BL20B2 Medical Imaging I
- X-ray micro-CT/laminography, phase-contrast CT, real-time imaging (absorption/refraction contrast), high-speed imaging, microangiography, and experiments using small animals
- R on fundamental techniques for evaluating optical elements and X-ray imaging
Persons in Charge | Kentaro Uesugi, Masato Hoshino
22

BL22XU JAEA Heavy Element Science I
(Japan Atomic Energy Agency)
- XAFS
- HAXPES
- Residual stress measurements
- High-temperature/high-pressure X-ray diffraction and X-ray absorption
- Atomic pair distribution function (PDF) measurements under a hydrogen atmosphere
- Coherent X-ray scattering and resonant X-ray diffraction
Persons in Charge | Hajime Tanida, Toru Kobayashi, Masaaki Obata
23

BL23SU JAEA Heavy Element Science II
(Japan Atomic Energy Agency)
- Surface chemistry using a supersonic molecular beam
- Photoelectron spectroscopy
- Magnetic circular dichroism
- Biophysical spectroscopy
Person in Charge | Shin-ichi Fujimori
24

BL24XU RIKEN Regional Collaboration I

Persons in Charge | Yoshimasa Urushihara, Shigeo Kuwamoto
25

BL25SU Soft X-ray Solid-State Spectroscopy
- Study of electronic states and band structures by photoelectron spectroscopy (PES) and angle-resolved photoelectron spectroscopy (ARPES)
- Analysis of surface atomic arrangements by photoelectron diffraction (PED)
- Study of element-selective magnetic states using X-ray magnetic circular dichroism (XMCD)
- Microscopic analysis and imaging of electronic states using a low-energy electron/photoelectron microscope (SPELEEM)
Persons in Charge | Naomi Kawamura, Kohei Yamagami
26

BL26B1 RIKEN Structural Genomics I
- Structural biology research based on X-ray crystallography
Persons in Charge | Tsuyoshi Ueno, Hideo Okumura, Takashi Kawamura, Kazuya Hasegawa
26

BL26B2 RIKEN Structural Genomics II
- Structural biology research based on X-ray crystallography
Person in Charge | Tsuyoshi Ueno

27

BL27SU Soft X-ray Photochemistry
- High-Energy Branch [B Branch]
  Use of high-energy soft X-rays (2.1–3.3 keV) with a Si(111) crystal spectrometer
  Soft X-ray absorption spectroscopy of dilute samples using the partial fluorescence yield method
  X-ray Fluorescence Analysis of light elements and elemental mapping measurements
  Scanning soft X-ray microspectroscopy using a µ-beam
- Low-Energy Branch [C Branch]
  Use of low-energy soft X-rays (0.17–2.2 keV) with a diffraction grating spectrometer
  Soft X-ray absorption spectroscopy of dilute samples using the partial fluorescence yield method
  Soft X-ray absorption spectroscopy under atmospheric-pressure conditions
  Soft X-ray absorption spectroscopy of liquid samples using a circulating solution cell
  Observation of Valence Band Electronic States by Soft X-ray Emission Spectroscopy
Contact | Kiyofumi Nitta, Hiroki Sekizawa, Toshinori Ina
28

BL28XU Advanced Battery Fundamental Technology Development (Kyoto University)
- In-situ/operando analysis of batteries and battery-related materials using the following techniques
- X-ray Diffraction (XRD)
- X-ray Absorption Spectroscopy (XAS)
- Hard X-ray Photoelectron Spectroscopy (HAXPES)
Person in charge | So Fujinami
28

BL28B2 White X-ray Diffraction
- White X-ray Diffraction: X-ray Topography and Energy-Dispersive Strain Measurement
- High-Energy (~200 keV) X-ray Micro-CT
- High-Speed X-ray Imaging, High-Energy X-ray Automated CT Measurement System
Persons in charge | Masato Hoshino, Kentaro Kajiwara, Yoshimasa Urushibara, Kentaro Uesugi
29

BL29XU RIKEN Physical Science I
- Coherent X-ray Optics
Person in charge | Yoshiki Kohmura
31

BL31LEP Laser-Electron Photon II
(Osaka University Research Center for Nuclear Physics)
- Generation of High-Intensity GeV Photon Beam by Laser Inverse Compton Scattering
- Hadron Physics by Photo-Nucleon and Photo-Nuclear Reactions
- Testing and Calibration of Detectors Using GeV Gamma Rays and Converted Electrons/Positrons
Person in charge| Takatsugu Ishikawa
32

BL32XU RIKEN Targeted Proteins
- Structural Biology
- Macromolecular X-ray Crystallography
- Microcrystal Structure Analysis
Person in charge | Kunio Hirata
32

BL32B2 Facility Development BM
- Synchrotron Radiation measurement technology development
Persons in charge | Hiroyuki Osumi, Yoshiki Kohmura
33

BL33XU Toyota (Toyota Central R Labs.)
- XAFS, Small-Angle X-ray Scattering, Imaging, X-ray Diffraction, Scanning 3D XRD Microscopy / Evaluation and Analysis of Automotive Materials
Person in charge | Kohei Okumura

33

BL33LEP Facility Diagnostics II
- Meson photoproduction from nucleon and nucleus
- Photoexcitation of hyperons, nucleon resonances, and other exotic states
- Photonuclear reactions
- Beam diagnoses
- Test and calibration of detectors with GeV photon beam
35

BL35XU Inelastic and Nuclear Resonant Scattering
- High-Resolution Inelastic X-ray Scattering Measurements (IXS)
  Material Dynamics at meV Energy Scale: Phonons and Elementary Excitations from Liquids and Glasses
- Research Using Nuclear Resonance (NRS)
  Electronic Properties by Mössbauer Spectroscopy Using Synchrotron Radiation (NFS/EDMS)
  Atomic and Molecular Dynamics by Nuclear Resonant Inelastic Scattering (meV region) and Quasi-Elastic Scattering (neV-µeV, TDI, Rayleigh scattering)
Persons in charge | Hiroyuki Fukui, Yoshitaka Yoda, Nobumoto Nagasawa, Takahiro Manjo
36

BL36XU RIKEN Material Science II
- Time-Resolved Quick XAFS Using Tapered Undulator Light
- Projection/Scanning/Imaging-Type XAFS Imaging
- X-ray Emission Spectroscopy (XES)
- Time-Resolved Simultaneous XAFS/XRD Measurements
- Experiments Using Pink Beam
Persons in charge | Tomoya Uruga, Kiyofumi Nitta, Kotaro Azuma
37

BL37XU Spectroscopic Analysis
- Spectroscopic Analysis Using X-ray Micro/Nanobeam
  Scanning X-ray Microspectroscopy Measurements
- X-ray Spectroscopic Imaging
  Projection-Type CT-XAFS
  Imaging-Type CT-XAFS
- Trace Element Analysis
- High-Energy X-ray Fluorescence Analysis
Persons in charge | Kiyofumi Nitta, Hiroki Sekizawa
38

BL38B1 RIKEN Structural Biology I
- Small-Angle X-ray Scattering
Persons in charge | Nobutaka Shimizu, Hiroshi Sekiguchi, Hiroyasu Masunaga
38

BL38B2 Facility Diagnostics I
- Accelerator Science, Accelerator Beam Diagnostics, Accelerator Component R&D
Persons in charge | Mitsuhiro Masaki, Kazuhiro Tamura
39

BL39XU X-ray Absorption and Emission Spectroscopy
- X-ray Magnetic Circular Dichroism Spectroscopy (XMCD)
- Element-Selective Magnetometry (ESM)
- X-ray Emission Spectroscopy and Its Magnetic Circular Dichroism
- XMCD Magnetic Imaging Using Micro/Nanobeam, XMCD and ESM Measurements of Micro-Regions and Micro-Samples
- XAFS and Chemical State Imaging of Micro-Regions Using 100 nm Beam
- XAFS and XMCD Measurements Under High Pressure (0-180 GPa @ room temperature, 0-40 GPa @ low temperature)
- X-ray Spectroscopy Using Various Polarization States
Persons in charge | Naomi Kawamura, Kotaro Azuma
40

BL40XU SAXS ID
- High-Speed Time-Resolved Diffraction and Scattering Experiments
- X-ray Photon Correlation Spectroscopy
- Diffraction and Scattering Experiments Using Microbeam
Persons in charge | Hiroshi Sekiguchi, Mitsuteru Aoyama, Satoshi Nagao

40

BL40B2 SAXS BM
- Non-Crystalline Small-Angle Wide-Angle Scattering Diffraction Experiments
Persons in charge | Noboru Ohta, Hiroshi Sekiguchi
41

BL41XU Macromolecular Crystallography I
- Macromolecular Structure Analysis
- Microcrystal Structure Analysis
- Ultra-High Resolution Structural Analysis
Persons in charge | Kiyoki Baba, Hideo Okumura, Takashi Kawamura, Naotaka Yano, Fangjia Luo, Takuya Masunaga, Kazuya Hasegawa
43

BL43IR Infrared Materials Science
- Infrared Microspectroscopy
Person in charge | Yuka Ikemoto
43

BL43LXU RIKEN Quantum NanoDynamics
- Atomic and Electronic Dynamics at meV Energy Scale Using Non-Resonant Inelastic X-ray Scattering
Person in charge | Alfred BARON
44

BL44XU Biological Supramolecular Complex Structure Analysis
(Osaka University Institute for Protein Research)
- Crystal Structure Analysis of Biological Supramolecular Complexes
  Membrane protein complexes, protein complexes, protein-nucleic acid complexes, viruses, etc.
Persons in charge | Atsushi Nakagawa, Eiki Yamashita
44

BL44B2 RIKEN Material Science I
- Structural Analysis of Periodic and Aperiodic Systems by Total Scattering
Person in charge | Kenichi Kato
45

BL45XU Macromolecular Crystallography II
- Macromolecular X-ray Crystallography
- Microcrystal Structure Analysis
- Automated & High-Throughput Measurements
- Single Particle Analysis (using ancillary cryo-electron microscope)
Persons in charge | Nobuhiro Mizuno, Yuki Nakamura, Naoki Sakai, Hironori Murakami, Hideki Shigematsu
46

BL46XU HAXPES Ⅱ
- Hard X-ray Photoelectron Spectroscopy
- Ambient-pressure hard X-ray photoelectron spectroscopy
Persons in charge | Satoshi Yasuno, Yasumasa Takagi, Seo Okkyun

47

BL47XU Micro-CT
- Projection tomography
- Imaging tomography
- Scanning X-ray microscope
Persons in charge | Kentaro Uesugi, Yoshimasa Urushihara, Hiroo Tajiri